NM 6/25/25 NM 6/25/25

Inspection and design of semiconductor inspection equipment

Electronics ＆ Semiconductors

NM 6/25/25 NM 6/25/25

Product Design and Analogy Layout Design

Electronics ＆ Semiconductors

NM 6/25/25 NM 6/25/25

CMOS image sensor product and system development

Electronics ＆ Semiconductors

NM 6/25/25 NM 6/25/25

Filter production improvement work

Electronics ＆ Semiconductors

NM 6/24/25 NM 6/24/25

Design, development and commercialization of filters

Electronics ＆ Semiconductors

NM 6/24/25 NM 6/24/25

Equipment inspection for semiconductor equipment

Electronics ＆ Semiconductors

NM 6/24/25 NM 6/24/25

General project management and support work for new product development

Electronics ＆ Semiconductors

NM 6/24/25 NM 6/24/25

Laser markers, ink jet printers, 3D measuring device development work

Electronics ＆ Semiconductors

NM 6/24/25 NM 6/24/25

Laser markers, ink jet printers, 3D measuring device development work (2)

Electronics ＆ Semiconductors

NM 6/24/25 NM 6/24/25

Test development work for semiconductor products developed by electronic device manufacturers

Electronics ＆ Semiconductors

NM 6/24/25 NM 6/24/25

LSI analog circuit design

Electronics ＆ Semiconductors

NM 1/22/25 NM 1/22/25

Experimental evaluation work of assembly process

Electronics ＆ Semiconductors

NM 1/17/25 NM 1/17/25

CIS Test System Development

Electronics ＆ Semiconductors

NM 1/17/25 NM 1/17/25

Image sensor measurement system development

Electronics ＆ Semiconductors

NM 1/17/25 NM 1/17/25

Wafer prototyping for commercialization development and work related to the preparation of an automated prototyping environment

Electronics ＆ Semiconductors

NM 1/17/25 NM 1/17/25

Responding to event reports as part of assembly and testing process PL work for IS products

Electronics ＆ Semiconductors

NM 1/17/25 NM 1/17/25

General CIS commercialization work in the industrial machinery field

エElectronics ＆ Semiconductors

NM 1/17/25 NM 1/17/25

Image sensor measurement/reliability work

Electronics ＆ Semiconductors

NM 1/17/25 NM 1/17/25

Support for engineers working on LITHO processes

Electronics ＆ Semiconductors

NM 1/17/25 NM 1/17/25

Analysis work centered on cross-sectional SEM observation

Electronics ＆ Semiconductors

Inspection and design of semiconductor inspection equipment

Product Design and Analogy Layout Design

CMOS image sensor product and system development

Filter production improvement work

Design, development and commercialization of filters

Equipment inspection for semiconductor equipment

General project management and support work for new product development

Laser markers, ink jet printers, 3D measuring device development work

Laser markers, ink jet printers, 3D measuring device development work (2)

Test development work for semiconductor products developed by electronic device manufacturers

LSI analog circuit design

Experimental evaluation work of assembly process

CIS Test System Development

Image sensor measurement system development

Wafer prototyping for commercialization development and work related to the preparation of an automated prototyping environment

Responding to event reports as part of assembly and testing process PL work for IS products

General CIS commercialization work in the industrial machinery field

Image sensor measurement/reliability work

Support for engineers working on LITHO processes

Analysis work centered on cross-sectional SEM observation

株式会社徳ヒロ

Tokuhiro Inc.